Workshop on Defect Analysis
in Silicon Detectors
Hamburg
August 2006




Hamburg
program.doc

23. August 2006

Deep Level Transistent Spectoscropy [DLTS]
Eckhart Fretwurst
DLTS-method-Fretwurst.ppt
Thermally Stimulated Current Method [TSC]
Ioana Pintilie
TSC-method-Pintilie.ppt
Photo Inducted Transient Spectroscopy [PITS]
Pawel Kaminsky
PITS-Kaminski.pdf
Photo Luminesence [PL]
Gordon Davies
PL-Davies.ppt
Infrared Spectoscropy [IR]
Leonid Murin
FTIR-Murin.ppt
Alternative Methodes
Juozas Vaitkus
Alternative-methods-Vaitkus.pdf
Overview on defects in silicon
Bengt Svenson
Overview-Svensson.ppt
DLTS results Oslo
Bengt Svenson
DLTS-results-Oslo-Bleka.ppt
DLTS results Hamburg
Frank Hönniger
DLTS-results-Hamburg-Hoenniger.pdf
DLTS results Minsk
Leonoid Makarenko
DLTS-results-Minsk-Makarenko.ppt
TSC Results Hamburg
Ioana Pintilie
TSC-results-Hamburg-Pintilie.ppt
I-DLTS and TSC results Florence
David Menichelli
menichelli_hamburg06.ppt
FTIR measurements on V2O and V3O Leonid Murin
FTIR-results-on-V2OandV3O-Murin.ppt
MW and IR  results Vilenius Eugenijus Gaubas MW-and-IR-results-Gaubas.ppt
Begin 24. August
Hamburg
The challange set by SLHC
Gunnar Lindström
Challenge-Lindstroem.ppt
Charge Trapping
Gregor Kramberger
Trapping-Review-Kramberger.ppt